X10 expansion microscopy enables 25‐nm resolution on conventional microscopes

Title
X10 expansion microscopy enables 25‐nm resolution on conventional microscopes
Authors
Keywords
-
Journal
EMBO REPORTS
Volume -, Issue -, Pages e45836
Publisher
EMBO
Online
2018-07-09
DOI
10.15252/embr.201845836

Ask authors/readers for more resources

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started