Evaluation of the Corrosion Resistance Properties of Electroplated Chitosan-Zn1-xCuxO Composite Thin Films

Novel chitosan-zinc copper oxide (Zn1-xCuxO) composites were electrochemically synthesized through galvanostatic deposition. The prepared chitosan-based composite thin films were elaborately investigated to determine their structural, morphological, compositional, impedance, and corrosion properties. X-ray diffraction analysis was performed to reveal their structural orientation of composite thin films. Energy dispersive analysis by X-ray evidently confirmed the existence of Zn, Cu, and O in the composite thin films. Nyquist plots revealed that the chitosan-Zn1-xCuxO thin films had obvious semi-circular boundaries, and higher resistance was observed for chitosan-ZnO due to the grain boundary effect. Corrosion properties were evaluated using both an electrochemical method and the ASTM weight gain method, which revealed good corrosion rates of 34 and 35 x 10(-3) mm/y, respectively, for chitosan-ZnO thin film.