Surface Passivation of Silicon Using HfO2 Thin Films Deposited by Remote Plasma Atomic Layer Deposition System

Title
Surface Passivation of Silicon Using HfO2 Thin Films Deposited by Remote Plasma Atomic Layer Deposition System
Authors
Keywords
HfO<sub>2</sub> thin films, Atomic layer deposition, O<sub>2</sub> plasma pretreatment, Surface passivation
Journal
Nanoscale Research Letters
Volume 12, Issue 1, Pages -
Publisher
Springer Nature
Online
2017-05-04
DOI
10.1186/s11671-017-2098-5

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