Experimental Route to Scanning Probe Hot-Electron Nanoscopy (HENs) Applied to 2D Material

Title
Experimental Route to Scanning Probe Hot-Electron Nanoscopy (HENs) Applied to 2D Material
Authors
Keywords
-
Journal
Advanced Optical Materials
Volume 5, Issue 15, Pages 1700195
Publisher
Wiley
Online
2017-06-09
DOI
10.1002/adom.201700195

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