Multitrait, Random Regression, or Simple Repeatability Model in High-Throughput Phenotyping Data Improve Genomic Prediction for Wheat Grain Yield

Published 2017 View Full Article

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Title
Multitrait, Random Regression, or Simple Repeatability Model in High-Throughput Phenotyping Data Improve Genomic Prediction for Wheat Grain Yield
Authors
Keywords
-
Journal
Plant Genome
Volume 10, Issue 2, Pages -
Publisher
Crop Science Society of America
Online
2017-05-19
DOI
10.3835/plantgenome2016.11.0111

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