Multitrait, Random Regression, or Simple Repeatability Model in High-Throughput Phenotyping Data Improve Genomic Prediction for Wheat Grain Yield

标题
Multitrait, Random Regression, or Simple Repeatability Model in High-Throughput Phenotyping Data Improve Genomic Prediction for Wheat Grain Yield
作者
关键词
-
出版物
Plant Genome
Volume 10, Issue 2, Pages -
出版商
Crop Science Society of America
发表日期
2017-05-19
DOI
10.3835/plantgenome2016.11.0111

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