Challenges in quantitative crystallographic characterization of 3D thin films by ACOM-TEM

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Title
Challenges in quantitative crystallographic characterization of 3D thin films by ACOM-TEM
Authors
Keywords
Nanocrystalline metals, STEM, ACOM-TEM, Quantitative crystallographic analysis, 180° ambiguity
Journal
ULTRAMICROSCOPY
Volume 173, Issue -, Pages 84-94
Publisher
Elsevier BV
Online
2016-07-05
DOI
10.1016/j.ultramic.2016.07.007

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