Challenges in quantitative crystallographic characterization of 3D thin films by ACOM-TEM

出版年份 2017 全文链接

标题

作者

关键词

Nanocrystalline metals, STEM, ACOM-TEM, Quantitative crystallographic analysis, 180° ambiguity

出版物

Volume 173, Issue -, Pages 84-94

出版商

Elsevier BV

发表日期

2016-07-05

DOI

10.1016/j.ultramic.2016.07.007

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