A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging

Published 2017 View Full Article

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Title
A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging
Authors
Keywords
Scanning transmission electron microscopy (STEM), Annular bright-field (ABF) imaging, Central bright-field (CBF) imaging, Sample tilt
Journal
ULTRAMICROSCOPY
Volume 173, Issue -, Pages 76-83
Publisher
Elsevier BV
Online
2016-11-26
DOI
10.1016/j.ultramic.2016.11.024

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