A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging

标题
A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging
作者
关键词
Scanning transmission electron microscopy (STEM), Annular bright-field (ABF) imaging, Central bright-field (CBF) imaging, Sample tilt
出版物
ULTRAMICROSCOPY
Volume 173, Issue -, Pages 76-83
出版商
Elsevier BV
发表日期
2016-11-26
DOI
10.1016/j.ultramic.2016.11.024

向作者/读者发起求助以获取更多资源

Reprint

联系作者

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started