An integrated and multi-purpose microscope for the characterization of atomically thin optoelectronic devices
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Title
An integrated and multi-purpose microscope for the characterization of atomically thin optoelectronic devices
Authors
Keywords
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Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 88, Issue 5, Pages 055102
Publisher
AIP Publishing
Online
2017-05-04
DOI
10.1063/1.4982358
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