Structural and morphological characterization of CdSe:Mn thin films

Published 2017 View Full Article

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Title
Structural and morphological characterization of CdSe:Mn thin films
Authors
Keywords
Morphology of films, X-ray diffraction, semiconductors, 68.55.J–, 61.05.cp, 61.82.Fk
Journal
PRAMANA-JOURNAL OF PHYSICS
Volume 89, Issue 1, Pages -
Publisher
Springer Nature
Online
2017-06-24
DOI
10.1007/s12043-017-1408-x
References
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