4.3 Article

Structural and morphological characterization of CdSe:Mn thin films

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PRAMANA-JOURNAL OF PHYSICS
卷 89, 期 1, 页码 -

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INDIAN ACAD SCIENCES
DOI: 10.1007/s12043-017-1408-x

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Morphology of films; X-ray diffraction; semiconductors

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CdSe: Mn thin films were grown by chemical bath deposition. The pH of the solution was maintained at 11. Dry films so obtained were annealed in vacuum (10(-1) Torr) for about 2 h at 400 degrees C. The annealed samples were subjected to morphological and structural characterization using scanning electron microscope and XRD. XRD was used for structural characterization whereas scanning electron microscope shows the surface morphology of the films. XRD spectra reveal that the grown CdSe films are polycrystalline in nature and have cubic structure. The average particle size decreases on doping CdSe with Mn ions. The FE-SEM images show spherical particles having uniform distribution. Optical characterization was done using PL studies and UV-Visible spectrophotometer. PL spectra show an increase in PL intensity on doping. Optical band gap also decreases on doping.

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