Extension of the Swanepoel method for obtaining the refractive index of chalcogenide thin films accurately at an arbitrary wavenumber

Published 2017 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Extension of the Swanepoel method for obtaining the refractive index of chalcogenide thin films accurately at an arbitrary wavenumber
Authors
Keywords
-
Journal
OPTICS EXPRESS
Volume 25, Issue 25, Pages 31273
Publisher
The Optical Society
Online
2017-12-02
DOI
10.1364/oe.25.031273

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.