Extension of the Swanepoel method for obtaining the refractive index of chalcogenide thin films accurately at an arbitrary wavenumber

标题
Extension of the Swanepoel method for obtaining the refractive index of chalcogenide thin films accurately at an arbitrary wavenumber
作者
关键词
-
出版物
OPTICS EXPRESS
Volume 25, Issue 25, Pages 31273
出版商
The Optical Society
发表日期
2017-12-02
DOI
10.1364/oe.25.031273

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