Thickness dependent study of RF sputtered ZnO thin films for optoelectronic device applications
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Title
Thickness dependent study of RF sputtered ZnO thin films for optoelectronic device applications
Authors
Keywords
ZnO thin films, thickness dependence, RF sputtering, surface morphological properties, optical properties
Journal
Electronic Materials Letters
Volume 11, Issue 6, Pages 1093-1101
Publisher
Springer Nature
Online
2015-10-28
DOI
10.1007/s13391-015-4445-y
References
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