Thickness dependence of optoelectronic properties in ALD grown ZnO thin films

Published 2013 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Thickness dependence of optoelectronic properties in ALD grown ZnO thin films
Authors
Keywords
-
Journal
APPLIED SURFACE SCIENCE
Volume 289, Issue -, Pages 27-32
Publisher
Elsevier BV
Online
2013-10-24
DOI
10.1016/j.apsusc.2013.10.071

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.