Probing the Surface Charge on the Basal Planes of Kaolinite Particles with High-Resolution Atomic Force Microscopy

Title
Probing the Surface Charge on the Basal Planes of Kaolinite Particles with High-Resolution Atomic Force Microscopy
Authors
Keywords
-
Journal
LANGMUIR
Volume 33, Issue 50, Pages 14226-14237
Publisher
American Chemical Society (ACS)
Online
2017-11-16
DOI
10.1021/acs.langmuir.7b03153

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