Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM)

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Title
Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM)
Authors
Keywords
Graphene, Thickness measurement, Atomic force microscopy, Histogram method
Journal
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
Volume 33, Issue 8, Pages 815-820
Publisher
Elsevier BV
Online
2016-12-21
DOI
10.1016/j.jmst.2016.07.020

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