Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM)

标题
Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM)
作者
关键词
Graphene, Thickness measurement, Atomic force microscopy, Histogram method
出版物
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
Volume 33, Issue 8, Pages 815-820
出版商
Elsevier BV
发表日期
2016-12-21
DOI
10.1016/j.jmst.2016.07.020

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