Theoretical modeling of electrical resistivity and Seebeck coefficient of bismuth nanowires by considering carrier mean free path limitation

Title
Theoretical modeling of electrical resistivity and Seebeck coefficient of bismuth nanowires by considering carrier mean free path limitation
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 121, Issue 1, Pages 014303
Publisher
AIP Publishing
Online
2017-01-03
DOI
10.1063/1.4973191

Ask authors/readers for more resources

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started