Focused ion beam processing to fabricate ohmic contact electrodes on a bismuth nanowire for Hall measurements

Published 2013 View Full Article

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Title
Focused ion beam processing to fabricate ohmic contact electrodes on a bismuth nanowire for Hall measurements
Authors
Keywords
Bismuth nanowire, Hall measurement, Focused ion beam, Ohmic contact, Thermoelectrics
Journal
Nanoscale Research Letters
Volume 8, Issue 1, Pages 400
Publisher
Springer Nature
Online
2013-09-26
DOI
10.1186/1556-276x-8-400
References
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