The Origin of the High Off-State Current in p-Type Cu2O Thin Film Transistors

Title
The Origin of the High Off-State Current in p-Type Cu2O Thin Film Transistors
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 38, Issue 10, Pages 1394-1397
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2017-09-09
DOI
10.1109/led.2017.2748064

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