Systematic Decomposition of the Positive Bias Stress Instability in Self-Aligned Coplanar InGaZnO Thin-Film Transistors

Published 2017 View Full Article

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Title
Systematic Decomposition of the Positive Bias Stress Instability in Self-Aligned Coplanar InGaZnO Thin-Film Transistors
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 38, Issue 5, Pages 580-583
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2017-03-11
DOI
10.1109/led.2017.2681204

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