Uniformity and Retention Improvement of TaOx-Based Conductive Bridge Random Access Memory by CuSiN Interfacial Layer Engineering

Published 2017 View Full Article

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Title
Uniformity and Retention Improvement of TaOx-Based Conductive Bridge Random Access Memory by CuSiN Interfacial Layer Engineering
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 38, Issue 9, Pages 1232-1235
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2017-08-03
DOI
10.1109/led.2017.2734907

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