StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images

出版年份 2016 全文链接

标题

作者

关键词

High-resolution (scanning) transmission electron microscopy (HR (S)TEM), Dataprocessing/image processing, Quantitative electron microscopy, General methods in microscopy, Statistical parameter estimation theory, Tools, Model-based fitting

出版物

ULTRAMICROSCOPY

Volume 171, Issue -, Pages 104-116

出版商

Elsevier BV

发表日期

2016-09-10

DOI

10.1016/j.ultramic.2016.08.018

向作者/读者发起求助以获取更多资源

Protocol

在线求助

Reagent

在线求助

Reprint

联系作者

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now