Preventing probe induced topography correlated artifacts in Kelvin Probe Force Microscopy

Published 2016 View Full Article

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Title
Preventing probe induced topography correlated artifacts in Kelvin Probe Force Microscopy
Authors
Keywords
Kelvin Probe Force Microscopy, Topography correlated artifact, Distance dependence, Probe change
Journal
ULTRAMICROSCOPY
Volume 171, Issue -, Pages 158-165
Publisher
Elsevier BV
Online
2016-09-21
DOI
10.1016/j.ultramic.2016.09.014

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