New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM

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Title
New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM
Authors
Keywords
Resistive switching, Random Telegraph Noise, Resolution, Time constants, RRAM
Journal
SOLID-STATE ELECTRONICS
Volume 115, Issue -, Pages 140-145
Publisher
Elsevier BV
Online
2015-09-03
DOI
10.1016/j.sse.2015.08.010

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