期刊
SOLID-STATE ELECTRONICS
卷 115, 期 -, 页码 140-145出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.sse.2015.08.010
关键词
Resistive switching; Random Telegraph Noise; Resolution; Time constants; RRAM
资金
- Spanish MINECO [TEC2011-27292-C02-02]
- ERDF [TEC2013-45638-C3-1-R]
- Generalitat de Catalunya - Spain [2014SGR-384]
Random Telegraph Noise (RTN) is one of the main reliability problems of resistive switching-based memories. To understand the physics behind RTN, a complete and accurate RTN characterization is required. The standard equipment used to analyse RTN has a typical time resolution of similar to 2 ms which prevents evaluating fast phenomena. In this work, a new RTN measurement procedure, which increases the measurement time resolution to 2 mu s, is proposed. The experimental set-up, together with the recently proposed Weighted Time Lag (W-LT) method for the analysis of RTN signals, allows obtaining a more detailed and precise information about the RTN phenomenon. (C) 2015 Elsevier Ltd. All rights reserved.
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