Multipactor threshold sensitivity to total electron emission yield in small gap waveguide structure and TEEY models accuracy

Title
Multipactor threshold sensitivity to total electron emission yield in small gap waveguide structure and TEEY models accuracy
Authors
Keywords
-
Journal
PHYSICS OF PLASMAS
Volume 23, Issue 12, Pages 123118
Publisher
AIP Publishing
Online
2016-12-28
DOI
10.1063/1.4972571

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