Multipactor threshold sensitivity to total electron emission yield in small gap waveguide structure and TEEY models accuracy

标题
Multipactor threshold sensitivity to total electron emission yield in small gap waveguide structure and TEEY models accuracy
作者
关键词
-
出版物
PHYSICS OF PLASMAS
Volume 23, Issue 12, Pages 123118
出版商
AIP Publishing
发表日期
2016-12-28
DOI
10.1063/1.4972571

向作者/读者发起求助以获取更多资源

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started