High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits
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Title
High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits
Authors
Keywords
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Journal
PHYSICAL REVIEW LETTERS
Volume 117, Issue 6, Pages -
Publisher
American Physical Society (APS)
Online
2016-08-05
DOI
10.1103/physrevlett.117.060504
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