标题
High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits
作者
关键词
-
出版物
PHYSICAL REVIEW LETTERS
Volume 117, Issue 6, Pages -
出版商
American Physical Society (APS)
发表日期
2016-08-05
DOI
10.1103/physrevlett.117.060504
参考文献
相关参考文献
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