Journal
OPTIK
Volume 127, Issue 19, Pages 8130-8134Publisher
ELSEVIER GMBH
DOI: 10.1016/j.ijleo.2016.06.008
Keywords
V doping; TiO2; Optical properties; Nano-structured; Thin film; Resistivity
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In this research, vanadium doped TiO2 (VTO) thin film was deposited on glass substrate using sol gel dip coating method. The structure, morphology, surface roughness, surface composition, optical and electrical properties of the thin films were investigated by X-ray diffraction, field emission scanning electron microscopy, atomic force microscopy, energy dispersive X-ray spectroscopy, UV-VIS NIR spectrophotometer and MEGGER resistivity meter, respectively. The X-ray diffraction showed that the VTO thin film had a poly-crystalline structure. The optical and electrical results indicated that vanadium addition decreased the band gap of the TiO2 thin film from 3.71 to 3.65 eV and resistivity from 16.7 x 10(7) to 1.7 x 10(7) Omega cm. (C) 2016 Elsevier GmbH. All rights reserved.
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