Dielectric relaxation behavior and conduction mechanism of Te 46 As 32 Ge 10 Si 12 films.

Title
Dielectric relaxation behavior and conduction mechanism of Te 46 As 32 Ge 10 Si 12 films.
Authors
Keywords
NSPT model, Debye-type relaxation process, Cole–Cole diagrams, Relaxation time
Journal
OPTIK
Volume 127, Issue 15, Pages 6232-6242
Publisher
Elsevier BV
Online
2016-04-14
DOI
10.1016/j.ijleo.2016.04.024

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