Structure evolution of the interfacial layer of BaTiO3 thin films during annealing process and related good resistive switching behaviors

Title
Structure evolution of the interfacial layer of BaTiO3 thin films during annealing process and related good resistive switching behaviors
Authors
Keywords
-
Journal
APL Materials
Volume 11, Issue 10, Pages -
Publisher
AIP Publishing
Online
2023-10-26
DOI
10.1063/5.0170098

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