Structure evolution of the interfacial layer of BaTiO3 thin films during annealing process and related good resistive switching behaviors
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Title
Structure evolution of the interfacial layer of BaTiO3 thin films during annealing process and related good resistive switching behaviors
Authors
Keywords
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Journal
APL Materials
Volume 11, Issue 10, Pages -
Publisher
AIP Publishing
Online
2023-10-26
DOI
10.1063/5.0170098
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