Schottky nanocontact of one-dimensional semiconductor nanostructures probed by using conductive atomic force microscopy

Published 2016 View Full Article

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Title
Schottky nanocontact of one-dimensional semiconductor nanostructures probed by using conductive atomic force microscopy
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 27, Issue 42, Pages 425711
Publisher
IOP Publishing
Online
2016-09-19
DOI
10.1088/0957-4484/27/42/425711

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