Schottky nanocontact of one-dimensional semiconductor nanostructures probed by using conductive atomic force microscopy

标题
Schottky nanocontact of one-dimensional semiconductor nanostructures probed by using conductive atomic force microscopy
作者
关键词
-
出版物
NANOTECHNOLOGY
Volume 27, Issue 42, Pages 425711
出版商
IOP Publishing
发表日期
2016-09-19
DOI
10.1088/0957-4484/27/42/425711

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