Thermal Boundary Resistance in GaN Films Measured by Time Domain Thermoreflectance with Robust Monte Carlo Uncertainty Estimation
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Title
Thermal Boundary Resistance in GaN Films Measured by Time Domain Thermoreflectance with Robust Monte Carlo Uncertainty Estimation
Authors
Keywords
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Journal
Nanoscale and Microscale Thermophysical Engineering
Volume 20, Issue 1, Pages 22-32
Publisher
Informa UK Limited
Online
2016-03-23
DOI
10.1080/15567265.2016.1154630
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