Comparisons between Dual and Tri Material Gate on a 32 nm Double Gate MOSFET

Investigation of Electrostatic Integrity of Nanoscale Dual Material Gate Dielectric Pocket Silicon-on-Void (DMGDPSOV) MOSFET for Improved Device Scalability

(2014) Vandana Kumari et al.   IEEE TRANSACTIONS ON NANOTECHNOLOGY

Impact of gate metal work-function engineering for enhancement of subthreshold analog/RF performance of underlap dual material gate DG-FET

(2014) Atanu Kundu et al.   MICROELECTRONICS RELIABILITY

Review and Critique of Analytic Models of MOSFET Short-Channel Effects in Subthreshold

(2012) Qian Xie et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Subthreshold analog/RF performance of underlap DG FETs with asymmetric source/drain extensions

(2012) Kalyan Koley et al.   MICROELECTRONICS RELIABILITY

Dual-Material Double-Gate SOI n-MOSFET: Gate Misalignment Analysis

(2009) Rupendra Kumar Sharma et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

A New Two-Dimensional Analytical Model for Nanoscale Symmetrical Tri-Material Gate Stack Double Gate Metal–Oxide–Semiconductor Field Effect Transistors

(2009) Mei-Li Chen et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Dual-Material Double-Layer Gate Stack SON MOSFET: A Novel Architecture for Enhanced Analog Performance—Part II: Impact of Gate-Dielectric Material Engineering

(2008) Poonam Kasturi et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Dual Material Double-Layer Gate Stack SON MOSFET: A Novel Architecture for Enhanced Analog Performance—Part I: Impact of Gate Metal Workfunction Engineering

(2008) Poonam Kasturi et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

A new two-dimensional analytical subthreshold behavior model for short-channel tri-material gate-stack SOI MOSFET’s

(2008) Te-Kuang Chiang   MICROELECTRONICS RELIABILITY