Review and Critique of Analytic Models of MOSFET Short-Channel Effects in Subthreshold

Published 2012 View Full Article

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Title
Review and Critique of Analytic Models of MOSFET Short-Channel Effects in Subthreshold
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 59, Issue 6, Pages 1569-1579
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-04-05
DOI
10.1109/ted.2012.2191556
References
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