Thermomechanical Challenges of 2.5-D Packaging: A Review of Warpage and Interconnect Reliability
Published 2023 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Thermomechanical Challenges of 2.5-D Packaging: A Review of Warpage and Interconnect Reliability
Authors
Keywords
-
Journal
IEEE Transactions on Components Packaging and Manufacturing Technology
Volume 13, Issue 10, Pages 1624-1641
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2023-09-21
DOI
10.1109/tcpmt.2023.3317383
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Enhancing predictability of thermal warpage by applying temperature-dependent Poisson's ratio of epoxy molding compound
- (2023) Junmo Kim et al. POLYMER TESTING
- Recent Advances and Trends in Advanced Packaging
- (2022) John H. Lau IEEE Transactions on Components Packaging and Manufacturing Technology
- Investigation of Warpage for Multi-Die Fan-Out Wafer-Level Packaging Process
- (2022) Chuan Chen et al. Materials
- Silicon-Interconnect Fabric for Fine-Pitch (≤10 μm) Heterogeneous Integration
- (2021) SivaChandra Jangam et al. IEEE Transactions on Components Packaging and Manufacturing Technology
- FE Simulation Model for Warpage Evaluation of Glass Interposer Substrate Packages
- (2021) Mengkai Shih et al. IEEE Transactions on Components Packaging and Manufacturing Technology
- Thermally-Induced Deformations and Warpages of Flip-Chip and 2.5D IC Packages Measured by Strain Gauges
- (2021) Ming-Yi Tsai et al. Materials
- Numerical simulation of reliability of 2.5D/3D package interconnect structure under temperature cyclic load
- (2021) Yang Liu et al. MICROELECTRONICS RELIABILITY
- Chiplet Heterogeneous Integration Technology—Status and Challenges
- (2020) Tao Li et al. Electronics
- Design guideline on board-level thermomechanical reliability of 2.5D package
- (2020) Shuai Shao et al. MICROELECTRONICS RELIABILITY
- A State-of-the-Art Review of Fatigue Life Prediction Models for Solder Joint
- (2019) Sinan Su et al. JOURNAL OF ELECTRONIC PACKAGING
- Effects of Metal Frame and Adhesive on Thermally-Induced Warpage and Stress of 2.5D Packages: Experimental and Numerical Studies
- (2018) Ming-Yi Tsai et al. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
- Study on Warpage and Reliability of Fan-Out Interposer Technology
- (2018) Fa Xing Che et al. IEEE Transactions on Components Packaging and Manufacturing Technology
- CMOS Scaling Trends and Beyond
- (2017) Mark T. Bohr et al. IEEE MICRO
- Electrical–Thermal Characterization of Through Packaging Vias in Glass Interposer
- (2017) Libo Qian et al. IEEE TRANSACTIONS ON NANOTECHNOLOGY
- Mechanism of warpage orientation rotation due to viscoelastic polymer substrates during thermal processing
- (2017) Cheolgyu Kim et al. MICROELECTRONICS RELIABILITY
- A Novel Speckle-Free Digital Image Correlation Method for In Situ Warpage Characterization
- (2017) Yuling Niu et al. IEEE Transactions on Components Packaging and Manufacturing Technology
- Design and Demonstration of a 2.5-D Glass Interposer BGA Package for High Bandwidth and Low Cost
- (2017) Brett M. D. Sawyer et al. IEEE Transactions on Components Packaging and Manufacturing Technology
- Measurement of Elastic Properties of Epoxy Molding Compound by Single Cylindrical Configuration with Embedded Fiber Bragg Grating Sensor
- (2016) Y. Sun et al. EXPERIMENTAL MECHANICS
- Prediction of deformation during manufacturing processes of silicon interposer package with TSVs
- (2016) Yeonsung Kim et al. MICROELECTRONICS RELIABILITY
- Fatigue life prediction of solder joints with consideration of frequency, temperature and cracking energy density
- (2013) J.H. Lee et al. INTERNATIONAL JOURNAL OF FATIGUE
- Impact of processing conditions and solder materials on surface mount assembly defects
- (2011) Rajen S. Sidhu et al. JOM
- Determination of Anand parameters for SnAgCuCe solder
- (2009) Liang Zhang et al. MODELLING AND SIMULATION IN MATERIALS SCIENCE AND ENGINEERING
Find the ideal target journal for your manuscript
Explore over 38,000 international journals covering a vast array of academic fields.
SearchBecome a Peeref-certified reviewer
The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.
Get Started