Thermomechanical Challenges of 2.5-D Packaging: A Review of Warpage and Interconnect Reliability

Title
Thermomechanical Challenges of 2.5-D Packaging: A Review of Warpage and Interconnect Reliability
Authors
Keywords
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Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2023-09-21
DOI
10.1109/tcpmt.2023.3317383

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