The distributed thermal model of fin field effect transistor

Published 2016 View Full Article

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Title
The distributed thermal model of fin field effect transistor
Authors
Keywords
Thermal model, Fin-FET, Dual-phase-lag, Fourier-Kirchoff, Knudsen number
Journal
MICROELECTRONICS RELIABILITY
Volume 67, Issue -, Pages 9-14
Publisher
Elsevier BV
Online
2016-10-28
DOI
10.1016/j.microrel.2016.09.021

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