X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm

Published 2016 View Full Article

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Title
X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm
Authors
Keywords
TSV, Defects inspection, X-ray, Self-organizing map network, Otsu algorithm
Journal
MICROELECTRONICS RELIABILITY
Volume 67, Issue -, Pages 129-134
Publisher
Elsevier BV
Online
2016-10-29
DOI
10.1016/j.microrel.2016.10.011

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