Nonlinearity analysis of TaOX redox-based RRAM

Published 2016 View Full Article

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Title
Nonlinearity analysis of TaOX redox-based RRAM
Authors
Keywords
Resistive RAM (RRAM), Non-Linearity, RESET and SET, Filament
Journal
MICROELECTRONIC ENGINEERING
Volume 154, Issue -, Pages 38-41
Publisher
Elsevier BV
Online
2016-01-24
DOI
10.1016/j.mee.2016.01.025

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