Nonlinearity analysis of TaOX redox-based RRAM

标题
Nonlinearity analysis of TaOX redox-based RRAM
作者
关键词
Resistive RAM (RRAM), Non-Linearity, RESET and SET, Filament
出版物
MICROELECTRONIC ENGINEERING
Volume 154, Issue -, Pages 38-41
出版商
Elsevier BV
发表日期
2016-01-24
DOI
10.1016/j.mee.2016.01.025

向作者/读者发起求助以获取更多资源

Reprint

联系作者

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search