The dramatic effect of the annealing temperature and dielectric functionalization on the electron mobility of indene-C60 bis-adduct thin films
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Title
The dramatic effect of the annealing temperature and dielectric functionalization on the electron mobility of indene-C60 bis-adduct thin films
Authors
Keywords
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Journal
CHEMICAL COMMUNICATIONS
Volume 51, Issue 25, Pages 5414-5417
Publisher
Royal Society of Chemistry (RSC)
Online
2015-02-07
DOI
10.1039/c5cc00151j
References
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