The dramatic effect of the annealing temperature and dielectric functionalization on the electron mobility of indene-C60 bis-adduct thin films

标题
The dramatic effect of the annealing temperature and dielectric functionalization on the electron mobility of indene-C60 bis-adduct thin films
作者
关键词
-
出版物
CHEMICAL COMMUNICATIONS
Volume 51, Issue 25, Pages 5414-5417
出版商
Royal Society of Chemistry (RSC)
发表日期
2015-02-07
DOI
10.1039/c5cc00151j

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