Impact of annealing treatment on structural and dc electrical properties of spin coated tungsten trioxide thin films for Si/WO3/Ag junction diode

Published 2016 View Full Article

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Title
Impact of annealing treatment on structural and dc electrical properties of spin coated tungsten trioxide thin films for Si/WO3/Ag junction diode
Authors
Keywords
Annealing temperature, P-n junction diodes, Tungsten trioxide, J-V-T characterization, Gaussian distribution
Journal
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 56, Issue -, Pages 145-154
Publisher
Elsevier BV
Online
2016-08-26
DOI
10.1016/j.mssp.2016.08.007

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