Atomic-scale structural evolution of Ta–Ni–Si amorphous metal thin films

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Title
Atomic-scale structural evolution of Ta–Ni–Si amorphous metal thin films
Authors
Keywords
Amorphous metal thin film, Transmission electron microscopy, Atom probe tomography
Journal
MATERIALS LETTERS
Volume 164, Issue -, Pages 9-14
Publisher
Elsevier BV
Online
2015-10-26
DOI
10.1016/j.matlet.2015.10.112

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